Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for reducing test resources in testing DRAMs

Apparatus and method for reducing test resources in testing DRAMs

US Patent 7168018 · Granted Jan 23, 2007

Estimated economic value: $2,294,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High-energy density shape memory polymers using strain-induced supramolecular na2025
Methods and devices for programming a state machine engine2025
Synchronous input buffer control using a write shifter2025
Methods and systems for handling data received by a state machine engine2025
Devices for time division multiplexing of state machine engine signals2024
System and method to control memory error detection with automatic disabling2024
Methods and systems for data analysis in a state machine2024
Systems and devices for accessing a state machine2024
Apparatus with refresh management mechanism2024
Methods and systems for handling data received by a state machine engine2023
Multi-level hierarchical routing matrices for pattern-recognition processors2023
Methods and systems for handling data received by a state machine engine2023