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Home › Apparatus and method for testing rambus DRAMs

Apparatus and method for testing rambus DRAMs

US Patent 6530045 · Granted Mar 4, 2003

Estimated economic value: $2,473,000 ⓘ

Assignee

Micron

Inventors

Christopher B. Cooper (7 patents)
Siang Tian Giam (4 patents)
Jerry McBride (7 patents)
Scott L. Ayres (4 patents)

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