Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring NBTI degradation effects on integrated circuits

Method for measuring NBTI degradation effects on integrated circuits

US Patent 6815970 · Granted Nov 9, 2004

Estimated economic value: $20,594,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods and compositions for natural killer cells2025
Methods and compositions for natural killer cells2023
Methods and compositions for natural killer cells2020
Methods and compositions for natural killer cells2019
Devices under test2017
Circuit aging sensor2017
Methods and compositions for natural killer cells2017
Methods and systems to determine a final value of random telegraph noise time co2015
Variability and aging sensor for integrated circuits2015
Electrostatic discharge protection apparatus2015
High performance asymmetric cascoded transistor2014
Transistor design and layout for performance improvement with strain2013