Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Nondestructive characterization of thin films using measured basis spectra

Nondestructive characterization of thin films using measured basis spectra

US Patent 6800852 · Granted Oct 5, 2004

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus to provide parallel acquisition of mass spectrometry/mass s2015
Sample holder apparatus to reduce energy of electrons in an analyzer system and 2011
Sample holder apparatus to reduce energy of electrons in an analyzer system and 2011
Hard disk drive controller having versatile chip connector having printed circui2009
System and method for depth profiling and characterization of thin films2008
System and method for depth profiling and characterization of thin films2008
System and method for depth profiling and characterization of thin films2008
Versatile dual port connector element arrangement2008
Post RIP image rendering in an electrographic printer to estimate toner consumpt2006
Nondestructive characterization of thin films based on acquired spectrum2005
Nondestructive characterization of thin films based on acquired spectrum2005
Control of surface potential of insulating specimens in surface analysis1999