Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of testing an integrated circuit having a flexible timing control

Method of testing an integrated circuit having a flexible timing control

US Patent 6775797 · Granted Aug 10, 2004

Estimated economic value: $621,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for authenticating an on-chip circuit and associated system on-chip2023
Method for writing data in a memory of a contactless transponder, and correspond2022
System for priming a latch between two memories and transferring data via the la2002
ARITHMETIC UNIT, DIGITAL SIGNAL PROCESSOR, METHOD OF SCHEDULING MULTIPLICATION I2002
Pipelined fast fourier transform processor2001
Smart debug interface circuit2001
HDL simulation interface for testing and verifying an ASIC model2001
Method and system for extending interrupt sources and implementing hardware base1999
Smart debug interface circuit for efficiently for debugging a software applicati1999
Interpolation filter of cascaded integrator-comb type1991