Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Real time defect source identification

Real time defect source identification

US Patent 6763130 · Granted Jul 13, 2004

Estimated economic value: $69,992,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Food components having high protein content2024
Starch aqueous fermentation feedstock and a method for the production thereo2023
Integrated mixotrophic fermentation method2021
Chemical mechanical polishing system having multiple polishing stations and prov2011
Chemical mechanical polishing system having multiple polishing stations and prov2009
Method and apparatus for processing a wafer2009
Conformal nanolaminate dielectric deposition and etch bag gap fill process2009
Method of forming a damascene structure with integrated planar dielectric layers2008
Integrated multi-step gap fill and all feature planarization for conductive mate2008
Chemical mechanical polishing apparatus with rotating belt2007
Chemical mechanical polishing system having multiple polishing stations and prov2007
Polishing apparatus having a trough2007