Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of determining non-accessible device I/O pin speed using on chip LFSR and MISR as data source and results analyzer respectively

Method of determining non-accessible device I/O pin speed using on chip LFSR and MISR as data source and results analyzer respectively

US Patent 6754867 · Granted Jun 22, 2004

Estimated economic value: $27,859,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dual-way sensing scheme for better neighboring word-line interference2025
Testing memories2008
System and method for testing a clock signal2001
Storage subsystem including an error correcting cache and means for performing m2000
Method and apparatus for utilizing mux scan flip-flops to test speed related def2000
Three state phase detector1999
Controlling power up using clock gating1998
Hierarchical clocking system using adaptive feedback1997
Address range extension for a modular computer1997
System and method for testing a clock signal1996
Preliminary polling for identification and location of removable/replaceable com1992
Smart memory card architecture and interface1989