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Home › Method and apparatus for utilizing mux scan flip-flops to test speed related defects by delaying an active to inactive transition of a scan mode signal

Method and apparatus for utilizing mux scan flip-flops to test speed related defects by delaying an active to inactive transition of a scan mode signal

US Patent 6023778 · Granted Feb 8, 2000

Estimated economic value: $400,660,000 ⓘ

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