Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Combined electrical test and mechanical test system for thin film characterization

Combined electrical test and mechanical test system for thin film characterization

US Patent 6752012 · Granted Jun 22, 2004

Estimated economic value: $14,063,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Pick and place machine cleaning system and method2023
System and method for cleaning wire bonding machines using functionalized surfac2022
System and method for cleaning contact elements and support hardware using funct2021
Device and method for thermal stabilization of probe elements using a heat condu2021
Wafer manufacturing cleaning apparatus, process and method of use2021
Pick and place machine cleaning system and method2020
Wafer manufacturing cleaning apparatus, process and method of use2020
Working surface cleaning system and method2019
Working surface cleaning system and method2019
Apparatuses, device, and methods for cleaning tester interface contact elements 2019
Wafer manufacturing cleaning apparatus, process and method of use2018
Wafer manufacturing cleaning apparatus, process and method of use2018