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Home › Structure, fabrication, and corrective test of electron-emitting device having electrode configured to reduce cross-over capacitance and/or facilitate short-circuit repair

Structure, fabrication, and corrective test of electron-emitting device having electrode configured to reduce cross-over capacitance and/or facilitate short-circuit repair

US Patent 6734620 · Granted May 11, 2004

Estimated economic value: $1,205,000 ⓘ

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