Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for testing integrated circuits

Systems and methods for testing integrated circuits

US Patent 6707313 · Granted Mar 16, 2004

Estimated economic value: $6,648,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Circuit and method for comparing circuit performance between functional and AC s2009
Hierarchically-controlled automatic test pattern generation2006
Hierarchically-controlled automatic test pattern generation2006
Systems and methods for facilitating testing of pads of integrated circuits2006
Method and apparatus for deriving a bounded set of path delay test patterns cove2006
Systems and methods for facilitating testing of pad drivers of integrated circui2006
System and method for evaluating an integrated circuit design2005
System and method for evaluating an integrated circuit design2005
Systems and methods for facilitating testing of pad receivers of integrated circ2005
Partitioning integrated circuit hierarchy2005
Partitioning integrated circuit hierarchy2005
Apparatus and method for generating a set of test vectors using nonrandom fillin2005