Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Memory tester tests multiple DUT's per test site

Memory tester tests multiple DUT's per test site

US Patent 6671844 · Granted Dec 30, 2003

Estimated economic value: $14,033,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Memory queue operations to increase throughput in an ATE system2025
Systems and methods of testing devices using CXL for increased parallelism2025
Automated test equipment with hardware accelerator2024
Automated test equipment for testing one or more devices under test, method for 2024
Automated test equipment for testing one or more devices under test, method for 2022
Integrated protocol analyzer configured within automated test equipment (ate) ha2021
Method and apparatus for providing UFS terminated and unterminated pulse width m2021
Adapting serdes receivers to a UFS receiver protocol2020
Method and apparatus to provide both high speed and low speed signaling from the2020
Method and system for advanced fail data transfer mechanisms2017
Testing memory devices with parallel processing operations2017
Testing memory devices with parallel processing operations2017