Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer level burn-in and electrical test system and method

Wafer level burn-in and electrical test system and method

US Patent 6562636 · Granted May 13, 2003

Estimated economic value: $347,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Undercarriage inspection assemblies and systems2025
Rail-side inspection assemblies and systems2025
System for testing an integrated circuit of a device and its method of use2025
Automated robotic system and method for sanitization and disinfection2025
Apparatus for testing electronic devices2024
Film stack simplification for high aspect ratio patterning and vertical scaling2024
Apparatus for testing electronic devices2024
Conformal damage-free encapsulation of chalcogenide materials2023
Self-aligned vertical integration of three-terminal memory devices2023
Automated robotic system and method for sanitization and disinfection2023
Automated robotic system and method for sanitization and disinfection2022
System for testing an integrated circuit of a device and its method of use2022