Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Non-contact mobile charge measurement with leakage band-bending and dipole correction

Non-contact mobile charge measurement with leakage band-bending and dipole correction

US Patent 6522158 · Granted Feb 18, 2003

Estimated economic value: $1,698,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Wear test apparatus2019
Methods and systems for characterizing photovoltaic cell and module performance 2017
High speed quantum efficiency measurement apparatus utilizing solid state lights2012
High speed detection of shunt defects in photovoltaic and optoelectronic devices2012
Systems configured to perform a non-contact method for determining a property of2010
Contactless charge measurement of product wafers and control of corona generatio2009
Methods for imperfect insulating film electrical thickness/capacitance measureme2008
Methods and systems for determining a property of an insulating film2008
In-situ wafer and probe desorption using closed loop heating2007
Method of measuring semiconductor wafers with an oxide enhanced probe2007
Method of detecting un-annealed ion implants2007
Contactless charge measurement of product wafers and control of corona generatio2007