Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Fast built-in self-repair circuit

Fast built-in self-repair circuit

US Patent 6505308 · Granted Jan 7, 2003

Estimated economic value: $4,521,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Encoding and decoding for PAM transmitter and receiver2025
Event triggered memory mapped access2014
Method and system for performing built-in-self-test routines using an accumulato2009
Method and system for performing built-in self-test routines using an accumulato2007
Method for testing semiconductor devices having built-in self repair (BISR) memo2006
Built-in redundancy analysis for memories with row and column repair2004
Multi-condition BISR test mode for memories with redundancy2003
Built-in self repair circuit with pause for data retention coverage2002
Built-in self-test unit having a reconfigurable data retention test2001
Redundancy analysis for embedded memories with built-in self test and built-in s2000
Reconfigurable built-in self test circuit1999
Refresh sampling built-in self test and repair circuit1999