Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for transforming pseudorandom binary patterns into test stimulus patterns appropriate for circuits having 1 of N encoded inputs

Method and apparatus for transforming pseudorandom binary patterns into test stimulus patterns appropriate for circuits having 1 of N encoded inputs

US Patent 6429795 · Granted Aug 6, 2002

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for a special stress mode for N-NARY logic that initializes2002
Method and apparatus for transforming pseudorandom binary test patterns into tes2001
Method and apparatus for built-in self-test of logic circuitry2001