Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of design for testability at RTL and integrated circuit designed by the same

Method of design for testability at RTL and integrated circuit designed by the same

US Patent 6185721 · Granted Feb 6, 2001

Estimated economic value: $160,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Designing of a logic circuit for testability2008
Method of design for testability, method of design for integrated circuits and i2004
Method of design for testability, test sequence generation method and semiconduc2003
Method of design for testability for integrated circuits2003
Method of generating test sequences2002
Method of design for testability and method of test sequence generation2001
Semiconductor integrated circuit and method for testing the semiconductor integr2001
Method of design for testability test sequence generation method and semiconduct2001
Method of design for testability, method of design for avoiding bus error and in2000
Design-for-testability method for path delay faults and test pattern generation 1998
Method of generating test sequence and apparatus for generating test sequence1998
Test sequence generation method1996