Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Aperture optimization method providing improved defect detection and characterization

Aperture optimization method providing improved defect detection and characterization

US Patent 5761336 · Granted Jun 2, 1998

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

3D microscope including insertable components to provide multiple imaging and me2025
3D microscope including insertable components to provide multiple imaging and me2025
3D microscope including insertable components to provide multiple imaging and me2022
3D microscope including insertable components to provide multiple imaging and me2022
3D microscope including insertable components to provide multiple imaging and me2022
3D microscope including insertable components to provide multiple imaging and me2022
3D microscope including insertable components to provide multiple imaging and me2021
3D microscope including insertable components to provide multiple imaging and me2021
Dual mode inspector2020
Optical measurement of step size and plated metal thickness2019
3D microscope and methods of measuring patterned substrates2019
3D microscope and methods of measuring patterned substrates2019