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Home › Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns

Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns

US Patent 5636229 · Granted Jun 3, 1997

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