Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5636229 | Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns | Mathias N. M. Muris | 1997-06-03 |
| 5097151 | Sequential finite-state machine circuit and integrated circuit | Mathias N. M. Muris | 1992-03-17 |
| 4967142 | Electronic module comprising a first substrate element with a functional part, and a second substrate element for testing an interconnection function, socket, substrate element and electronic apparatus therefor | Wilhelm A. Sauerwald, Anwar Osseyran, Franciscus G. M. De Jong | 1990-10-30 |