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Home › Apparatus for magnetic inspection using magnetic shield, with specific relation of distance E between magnetic sensors and distance L between each magnetic sensor and the object to be inspected, to obtain optimum S/N

Apparatus for magnetic inspection using magnetic shield, with specific relation of distance E between magnetic sensors and distance L between each magnetic sensor and the object to be inspected, to obtain optimum S/N

US Patent 5502382 · Granted Mar 26, 1996

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