Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit electromigration monitor

Integrated circuit electromigration monitor

US Patent 5264377 · Granted Nov 23, 1993

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Conductive line-based temperature-sensing device2021
Device signature generation2020
Surface acoustic wave filter with a cap layer for improved reliability2018
Active atomic reservoir for enhancing electromigration reliability in integrated2017
Methods, systems, and apparatuses for temperature compensated surface acoustic w2016
Routing under bond pad for the replacement of an interconnect layer2012
Electrostatic discharge protection pattern for high voltage applications2011
Thermal monitoring and management of integrated circuits2011
Structure and method for fabricating flip chip devices2010
MIM capacitor integrated into the damascene structure and method of making there2010
Selective isotropic etch for titanium-based materials2009
High current interconnect structure for IC memory device programming2008