Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material

Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material

US Patent 4229652 · Granted Oct 21, 1980

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Creating and utilizing network restore points2013
Creating and utilizing network restore points2012
Incremental compilation of C++ programs2001
Aperture piece and method for calibrating backscatter thickness measuring instru1984
Probe guide and holder1982
Probe assembly for measuring conductivity of plated through holes1981
Backscatter instrument having indexing feature for measuring coating thickness o1980
Backscatter instrument having indexing feature for measuring coating thickness o1980
Backscatter instrument having indexing feature for measuring coating thickness o1980