Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe assembly for measuring conductivity of plated through holes

Probe assembly for measuring conductivity of plated through holes

US Patent 4245189 · Granted Jan 13, 1981

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Incremental compilation of C++ programs2001
Calibration standard for X-ray fluorescence thickness1987
Probe guide and holder1982
Backscatter apparatus and method for measuring thickness of a continuously movin1980
Backscatter instrument having indexing feature for measuring coating thickness o1980