Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4437000 | Aperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpieces | — | 1984-03-13 |
| 4229652 | Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material | Derek Lieber, William D. Hay | 1980-10-21 |
| 4190770 | Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material | James Stuart Saunders, William D. Hay, Derek Lieber | 1980-02-26 |