Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and apparatuses for transient fault detection

Methods and apparatuses for transient fault detection

US Patent 12454274 · Granted Oct 28, 2025

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Adjustable 3D capacitor2006
Method to produce dual gates (one metal and one poly or metal silicide) for CMOS2005
Method to pattern small features by using a re-flowable hard mask2004
Method for forming a via in a damascene process2004
Method of self-aligning a damascene gate structure to isolation regions2004
Adjustable 3D capacitor2004
Method for reducing gouging during via formation2004
Method to fabricate a single gate with dual work-functions2003
Method of fabricating variable length vertical transistors2003
Method for making three-dimensional metal-insulator-metal capacitors for dynamic2003
Forming dual gate oxide thickness on vertical transistors by ion implantation2003
Method of forming small transistor gates by using self-aligned reverse spacer as2003