Method for calibrating parameter error of electron probe microanalysis instrument

Assignee

• Tongji University

Inventors

• Lihua Lei (7 patents)
• Chengming CAO (1 patents)
• Yingfan Xiong (1 patents)
• Zhangning Xie (1 patents)
• Xiao DENG (3 patents)
• Xinbin CHENG (2 patents)
• Yuqing GUAN (1 patents)
• Wenzhe ZOU (1 patents)
• Yunxia FU (1 patents)

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