Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332195 | Method for calibrating parameter error of electron probe microanalysis instrument | Lihua Lei, Chengming CAO, Yingfan Xiong, Zhangning Xie, Xiao DENG +3 more | 2025-06-17 |
| 11802758 | System for precision displacement measurement based on self-traceable grating interference | Xiao DENG, Zichao Lin, Zhenjie GU, Yulin Yao, Tongbao LI | 2023-10-31 |