Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect detection method of deep learning-based semiconductor device and semiconductor element manufacturing method including the defect detection method

Defect detection method of deep learning-based semiconductor device and semiconductor element manufacturing method including the defect detection method

US Patent 12229944 · Granted Feb 18, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electronic apparatus and controlling method thereof2025
Electronic device including processor executing defect detection module, operati2025
Method of forming optical proximity correction model and method of fabricating s2025
Static random-access memory (SRAM) device including three-dimensional stacked (32025
Method of detecting measurement error of SEM equipment and method of aligning SE2025
Computing device for predicting a profile using deep learning and operating meth2025
Method of forming shape on mask based on deep learning, and mask manufacturing m2023
Method of verifying error of optical proximity correction model2023
Manufacturing method of semiconductor device2023
Method for correcting a mask layout and method of fabricating a semiconductor de2020
Method and apparatus for correcting assist-feature-printing errors in a layout2011