Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Automatic test system and automatic test method for integrated-circuit devices

Automatic test system and automatic test method for integrated-circuit devices

US Patent 12158494 · Granted Dec 3, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Many-core definable distributed shared storage structure2025
System for application protection and non-transitory machine-readable medium for2025
Control system using device controllers and device root to manage processing uni2025
Model protection system2025
Dynamic loading neural network inference at DRAM/on-bus SRAM/serial flash for po2025
Memory protection for virtual machines2024
Semiconductor device having 2D channel layer2023
Dynamic agent for multiple operators optimization2023
Cache management method using object-oriented manner and associated microcontrol2023
Semiconductor device and manufacturing method thereof2022
Cache management method using object-oriented manner and associated microcontrol2020
Touch rim control method and associated device2018