Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Device and method for detecting defects on wafer

Device and method for detecting defects on wafer

US Patent 12118708 · Granted Oct 15, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Imaging composition comprising porous silicon micro-particles2025
Polyphenylene ether composition2025
Electronic device including processor executing defect detection module, operati2025
Method of forming optical proximity correction model and method of fabricating s2025
Axle beam for a trailer2025
Brake disc for a trailer2025
Brake disc for trailer2025
Magnetic device2025
Method for manufacturing a light emitting element including a quantum dot compos2025
Method, electronic device and operating method of electronic device and manufact2025
Method, electronic device and operating method of electronic device and manufact2025
Method, electronic device and operating method of electronic device and manufact2025