Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12118708 | Device and method for detecting defects on wafer | Min-Cheol Kang, Do-Nyun Kim, Jaehoon Kim | 2024-10-15 |
| 11747721 | Method of forming shape on mask based on deep learning, and mask manufacturing method using the method of forming the shape on mask | Useong Kim, Mincheol KANG | 2023-09-05 |