Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for testing redundant fuse latches in a memory device

Systems and methods for testing redundant fuse latches in a memory device

US Patent 12100467 · Granted Sep 24, 2024

Estimated economic value: $58,106,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatuses and methods including dice latches in a semiconductor device2025
Apparatuses and methods including dice latches in a semiconductor device2025
Apparatus with adjustable diagnostic mechanism and methods for operating the sam2025
Apparatus with adjustable diagnostic mechanism and methods for operating the sam2025
Apparatus with adjustable diagnostic mechanism and methods for operating the sam2025
Apparatuses and methods for dynamic column select swapping2025
Apparatus with calibration input mechanism and methods for operating the same2025
Memory with per die temperature-compensated refresh control2025
Intelligent door lock system in communication with mobile device that stores ass2025
Test mode security circuit2024
Test mode security circuit2024
Test mode security circuit2024