Assignee
- Mettler-Toledo (Changzhou) Precision Instruments
- Mettler-Toledo (Changzhou) Measurement Technology
- Mettler-Toledo International Trading (Shanghai) Co.
Inventors
- Jianwei Wu (10 patents)
- Jianqiang Yang (6 patents)
- Liugang Bi (1 patents)
US Patent 12007270 · Granted Jun 11, 2024