JY

Jianqiang Yang

MI Mettler-Toledo (Changzhou) Precision Instruments: 4 patents #5 of 122Top 5%
MT Mettler-Toledo (Changzhou) Measurement Technology: 3 patents #12 of 125Top 10%
GE: 2 patents #13,562 of 36,430Top 40%
MT Mettler-Toledo Measurement Technology: 1 patents #6 of 16Top 40%
Overall (All Time): #778,541 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
12276539 Method and device for diagnosing weighing system Lifeng Cai, Jianwei Wu 2025-04-15
12268540 Suspension device and x-ray imaging system Yuqing Li, Shaobo Gu, Chunyu Wang 2025-04-08
12056761 Method and apparatus for managing measurement device based on blockchain Guojun Xie 2024-08-06
12007270 Status detection method and apparatus for load cell Jianwei Wu, Liugang Bi 2024-06-11
11378441 Collaborative weighing and measuring system and metering system Feng Dai, Guojun Xie, Jinquan Yu, Wenming Mao, Dake Tan 2022-07-05
10765396 X-ray imaging apparatus and X-ray imaging system Pengfei Du, Shaobo Gu 2020-09-08