Assignee
- Mettler-Toledo (Changzhou) Precision Instruments
- Mettler-Toledo (Changzhou) Measurement Technology
- Mettler-Toledo International Trading (Shanghai) Co.
Inventors
- Jianwei Wu (10 patents)
- Jean-Christophe Emery (21 patents)
US Patent 11573120 · Granted Feb 7, 2023