Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of measuring variation, inspection system, computer program, and computer system

Method of measuring variation, inspection system, computer program, and computer system

US Patent 11966168 · Granted Apr 23, 2024

Estimated economic value: $133,313,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for predicting process information with a parameterized model2025
Method in the manufacturing process of a device, a non-transitory computer-reada2025
Methods and apparatus for obtaining diagnostic information relating to an indust2025
Method and apparatus for predicting substrate image2025
Aligning a distorted image2025
Metrology apparatus and method for determining a characteristic of one or more s2024
Metrology method2024
Methods and apparatus for obtaining diagnostic information relating to an indust2024
Systems and methods for predicting layer deformation2024
Deep learning for semantic segmentation of pattern2023
Deep learning for semantic segmentation of pattern2023
Method and apparatus for image analysis2023