Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of color inspection by using monochrome imaging with multiple wavelengths of light

Method of color inspection by using monochrome imaging with multiple wavelengths of light

US Patent 11825211 · Granted Nov 21, 2023

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method of object inspection using multispectral 3D laser scanning2024
System and method of object inspection using multispectral 3D laser scanning2024
System and method of object inspection using multispectral 3D laser scanning2024
System and method for inspecting a wafer2020
System and method for inspecting a wafer2018
Methods of inspecting a 3D object using 2D image processing2018
Methods of inspecting a 3D object using 2D image processing2018
System and method for inspecting a wafer2014