Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for testing critical components on system-on-chip

System and method for testing critical components on system-on-chip

US Patent 11422185 · Granted Aug 23, 2022

Estimated economic value: $28,080,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Architecture for managing asynchronous resets in a system-on-a-chip2025
System and method for managing secure memories in integrated circuits2024
Fault recovery system for functional circuits2024
System and method for managing faults in integrated circuits2023
Glitch detector2023
Method and system for managing fault recovery in system-on-chips2023
Testing of lockstep architecture in system-on-chips2023
System and method for controlling faults in system-on-chip2022
System and method for controlling faults in system-on-chip2022
Clock sweeping system2022
Glitch detector2022
System and method for managing testing and availability of critical components o2021