Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for detecting abnormal die

Method and system for detecting abnormal die

US Patent 11378620 · Granted Jul 5, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Memory inspecting method and memory inspecting system2021
Device for detecting defective global word line2015
Method of detecting connection defects of memory and memory capable of detecting2014
Method of performing a chip burn-in scanning with increased efficiency2013
Word line defect detecting device and method thereof2011
Method for detecting erroneous word lines of a memory array and device thereof2009