Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Local clock injection and independent capture for circuit test of multiple cores in clock mesh architecture

Local clock injection and independent capture for circuit test of multiple cores in clock mesh architecture

US Patent 11042181 · Granted Jun 22, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High bandwidth IJTAG through high speed parallel bus2025
Asynchronous interface for transporting test-related data via serial channels2023
Multi-capture at-speed scan test based on a slow clock signal2023
Clock gating and scan clock generation for circuit test2021
Efficient and flexible network for streaming data in circuits2020
Streaming networks efficiency using data throttling2020
Data streaming for testing identical circuit blocks2019
Data generation for streaming networks in circuits2019
Test access architecture for multi-die circuits2016
Test access architecture for stacked dies2016
Efficient execution of color space processing functions in a graphics processing2013
Methods for at-speed testing of memory interface2013