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Home › System, method and apparatus for macroscopic inspection of reflective specimens

System, method and apparatus for macroscopic inspection of reflective specimens

US Patent 10915992 · Granted Feb 9, 2021

Assignee

Nanotronics Imaging

Inventors

Matthew C. Putman (104 patents)
John B. Putman (94 patents)
John Moffitt (8 patents)
Michael Moskie (17 patents)
Jeffrey Andresen (8 patents)
Scott Pozzi-Loyola (10 patents)
Julie Orlando (27 patents)

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