Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Viscoelastic pad upon integrated circuit device contact for multipass electrical characterization probe testing

Viscoelastic pad upon integrated circuit device contact for multipass electrical characterization probe testing

US Patent 10901030 · Granted Jan 26, 2021

Estimated economic value: $1,788,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

BEOL interconnect subtractive etch super via2025
Layered bottom electrode dielectric for embedded MRAM2025
Metal hard mask integration for active device structures2025
Patterning magnetic tunnel junctions and the like while reducing detrimental res2025
MRAM integration with self-aligned direct back side contact2025
Fatigue failure resistant electronic package2025
Zero expansion in a replacement metal gate process with a spacer2025
Selective ILD deposition for fully aligned via with airgap2025
Method and system for acquiring data for assessment of cardiovascular disease2024
Method and system for cardiovascular disease assessment and management2024
Exploratory data interface2024
Semiconductor device including a porous dielectric layer, and method of forming 2024