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Home › Memory devices and methods for read disturb mitigation involving word line scans to detect localized read disturb effects and to determine error count in tracked sub sets of memory addresses

Memory devices and methods for read disturb mitigation involving word line scans to detect localized read disturb effects and to determine error count in tracked sub sets of memory addresses

US Patent 10770156 · Granted Sep 8, 2020

Estimated economic value: $15,881,000 ⓘ

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