Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Ellipsometer and method for estimating thickness of film

Ellipsometer and method for estimating thickness of film

US Patent 10760896 · Granted Sep 1, 2020

Estimated economic value: $11,573,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Metrology method2025
Extreme ultraviolet lithography system2025
Semiconductor lithography system and/or method2025
Post-routing congestion optimization2025
Method for forming a semiconductor structure using dehydrating chemical, and met2025
Method for forming a semiconductor structure using dehydrating chemical, and met2025
Hard-to-fix (HTF) design rule check (DRC) violations prediction2025
Width adjustment of EUV radiation beam2025
Method of manufacturing a semiconductor device2025
Method of manufacturing a semiconductor device2025
EUV photomask and manufacturing method of the same2025
EUV photomask and manufacturing method of the same2025