Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for measuring patterns

System and method for measuring patterns

US Patent 10692693 · Granted Jun 23, 2020

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method, apparatus, and program for determining condition related to captured ima2025
Pattern inspecting device2024
Pattern inspecting device2024
Charged particle beam device2023
Calibration sample, electron beam adjustment method and electron beam apparatus 2022
Electronic microscope device2022
Inspection device2022
Scanning electron microscope2022
Electron gun and electron beam application device2022
Measurement device, method and display device2021
Electron beam device2020
Electron microscope device and inclined hole measurement method using same2020