Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Cantilever set for atomic force microscopes, substrate surface inspection apparatus including the same, method of analyzing surface of semiconductor substrate by using the same, and method of forming micropattern by using the same

Cantilever set for atomic force microscopes, substrate surface inspection apparatus including the same, method of analyzing surface of semiconductor substrate by using the same, and method of forming micropattern by using the same

US Patent 10352964 · Granted Jul 16, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Near field communication device, terminal device having the same, and operation 2025
Convenience equipment pull-out device for a vehicle2024
Pose estimation apparatus and method for robotic arm to grasp target based on mo2024
Leg massager for massage chair2024
Display device and manufacturing method therefor2024
Graphene-based fiber and graphene-based carbon fiber and method of manufacturing2023
Polymer-graphene liquid crystal fiber and a carbon fiber produced by the same an2022
Positive electrode for Zn—Br battery (ZBB) and method of manufacturing the same2022
Cleaner and method for controlling cleaner2021
Face mask pack2020
Method of fabricating pattern structure2020
Methods of forming fine patterns2020