Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs

Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs

US Patent 10088525 · Granted Oct 2, 2018

Estimated economic value: $28,942,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Secured scan access for a device including a scan chain2025
Secured scan access for a device including a scan chain2024
Generating multiple pseudo static control signals using on-chip JTAG state machi2024
Generating multiple pseudo static control signals using on-chip JTAG state machi2024
Full pad coverage boundary scan2023
Scan test control decoder with storage elements for use within integrated circui2023
Generating multiple pseudo static control signals using on-chip JTAG state machi2022
Generating multiple pseudo static control signals using on-chip JTAG state machi2022
Scan test control decoder with storage elements for use within integrated circui2022
Full pad coverage boundary scan2021
Non-interleaved scan operation for achieving higher scan throughput in presence 2020
Non-interleaved scan operation for achieving higher scan throughput in presence 2020