Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Inspecting a wafer using image and design information

Inspecting a wafer using image and design information

US Patent 10042974 · Granted Aug 7, 2018

Estimated economic value: $2,817,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor inspection tool system and method for wafer edge inspection2025
Semiconductor inspection tool system and method for wafer edge inspection2023
Automatic defect classification2022
Hierarchical wafer inspection2020
Objective lens2020
Continuous light inspection2019
Inspection system and a method for inspecting a diced wafer2019
Inspection system and a method for inspecting a diced wafer2019
High throughput and low cost height triangulation system and method2017
Inspection recipe generation and inspection based on an inspection recipe2014
System and method for inspection2012
Inspection system and a method for detecting defects based upon a reference fram2012