Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10203289 | Inspection system and a method for inspecting a diced wafer | Menachem Regensburger | 2019-02-12 |
| 10042974 | Inspecting a wafer using image and design information | Menachem Regensburger | 2018-08-07 |
| 8238645 | Inspection system and a method for detecting defects based upon a reference frame | Menachem Regensburger | 2012-08-07 |
| 8233699 | Inspection system and a method for detecting defects based upon a reference frame | Menachem Regensburger | 2012-07-31 |
| 8208713 | Method and system for inspecting a diced wafer | Menachem Regensburger | 2012-06-26 |